₺1,400 unit for Surface General Survey Determination of the content of the material and the bonds between atoms with one-thousandth precision (TEMPORARILY UNAVAILABLE) quantity Add to cart Description Description Service Device/System: X-ray photoelectron spectroscopy (XPS) Brand-Model of Service Device/System Type: PHI Related products Structure and phase analysis by Raman spectroscopy method ₺500 TK Structure and phase analysis by Raman spectroscopy method quantity Add to cart Surface temperature measurement with high precision ₺500 TK Surface temperature measurement with high precision quantity Add to cart Solar cell efficiency measurement on an industrial scale under a continuously radiating light source ₺400 TK Solar cell efficiency measurement on an industrial scale under a continuously radiating light source quantity Add to cart Surface composition analysis by scanning electron beam ₺2,000 TK Surface composition analysis by scanning electron beam quantity Add to cart
Description Service Device/System: X-ray photoelectron spectroscopy (XPS) Brand-Model of Service Device/System Type: PHI