Measurement of active dopant concentration in depth by chemical etching of solar cells


um depth


Service Device/System: Electrochemical Capacitance‐Voltage Measurement (ECV)

Brand-Model of Service Device/System Type: WEP/CVP21

Description: During the systematic chemical etching of the solar cell surface, it provides information about the doping rate of the cell by the method of determining the number of charge carriers in layers.