₺40,000 low temperature Measurement of defects by the behavior of electrons in the material quantity Add to cart Description Description Service Device/System: Electron paramagnetic resonance (EPR/ESR) Brand-Model of Service Device/System Type: Bruker Related products Surface topography roughness measurements with high resolution atomic force microscopy ₺1,600 TK Surface topography roughness measurements with high resolution atomic force microscopy quantity Add to cart Imaging and mapping the structural defects of solar cells by photoluminescence method ₺2,000 TK Imaging and mapping the structural defects of solar cells by photoluminescence method quantity Add to cart Surface temperature measurement with high precision ₺1,000 TK Surface temperature measurement with high precision quantity Add to cart Surface resistance measurement ₺600 TK Surface resistance measurement quantity Add to cart
Description Service Device/System: Electron paramagnetic resonance (EPR/ESR) Brand-Model of Service Device/System Type: Bruker