Description
Service Device/System: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Brand-Model of Service Device/System Type: ION-TOF5
₺6,000
unit for Intensity vs. Sputter-Time
Related products
-
Solar cell efficiency measurement on an industrial scale under a continuously radiating light source
₺800 -
Measurement of quantum efficiency of solar cells under cascade monochromatic radiation
₺4,000 -
Structure and phase analysis by Raman spectroscopy method
₺1,000 -
Measurement and sorting efficiencies of industrial-scale solar cells
₺800