SERVICE REQUEST FORM
SERVICE DEVICE LIST and DESCRIPTIONS
Code | Service | Unit | Price (TL) |
---|---|---|---|
H0001 | Determination of the content of the material and the bonds between atoms with one-thousandth precision | per sample | 6,045.00 |
H0002 | Boron (B) doping process | per hour | 4,000.00 |
H0003 | Spin coating | Up to 1 hour | 1,200.00 |
H0004 | Spin coating | Up to 1 hour | 1,000.00 |
H0005 | Doping Activation Energy Measurement by Current-Voltage Measurement at Cryogenic Temperatures | per sample | 12,955.00 |
H0006 | Defect analysis with the effect of Photoluminescence at Cryogenic Temperatures | per sample | 17,272.00 |
H0007 | Screen Printing Metallization | per hour | 16,000.00 |
H0008 | Screen Printing Metallization | per hour | 12,000.00 |
H0009 | Measurement of active dopant conce ntration in depth by Electrochemical Capacitance-Voltage (ECV) | per hour | 3,000.00 |
H0010 | Electroluminescence Imaging (EL) (Module) | per sample | 2,160.00 |
H0011 | Electroluminescence Imaging (Small area) | Up to 1 hour | 900.00 |
H0012 | Maximum Power Test (Double-Sided PV Panels) | per sample | 6,980.00 |
H0013 | Maximum Power Test (Single-Sided PV Panels) | per sample | 5,040.00 |
H0014 | Solar cell efficiency measurement on an industrial size | per sample | 400.00 |
H0015 | Solar Cell efficiency measurement under flash light | per sample | 400.00 |
H0016 | Pseudo-efficiency measurement of a solar cell under flash light | per sample | 1,730.00 |
H0017 | Determination of flash-induction interaction charge carrier lifetime depending on temperature | per sample | 6,480.00 |
H0018 | Phosphorus (P) doping process | per hour | 3,000.00 |
H0019 | Outdoor tests of photovoltaic modules | per month | 17,275.00 |
H0020 | FTIR in glovebox | Up to 1 hour | 900.00 |
H0021 | Imaging and mapping the structural defects of solar cells by photoluminescence method | per sample | 4,320.00 |
H0022 | Measurement of metal contact resistance of solar cells (including sample preparation) | per hour | 2,000.00 |
H0023 | Determination of solar cell contact damages by electroluminescence method | per sample | 200.00 |
H0024 | Horizontal and vertical dimension measurement of phenomena on the surface of solar cells | per sample | 1,730.00 |
H0025 | 18 kWe Solar Simulator use for concentrated solar energy applications | per sample | Pricing will be customized based on demand |
H0026 | I-V measurement in ambient conditions (Small area) | per hour | 900.00 |
H0027 | I-V measurement in glove box (Small area) | per hour | 1,000.00 |
H0028 | Implantation processes (B, P, BF2, F, Ar) | per hour | 12,000.00 |
H0029 | Current-voltage measurement in thin-film solar cells | per sample | 1,300.00 |
H0030 | Interstitial Oxygen and Carbon Content Concentration Analysis of Materials by Infrared Ray Absorbtion | per sample | 17,272.00 |
H0031 | Measurement of quantum efficiency of solar cells under cascade monochromatic radiation | per sample | 8,635.00 |
H0032 | Determination of right-angle and diffuse transmittance properties of materials under stepped monochromatic radiation | per sample | 6,480.00 |
H0033 | Determination of right-angle and diffuse reflection properties of materials under stepped monochromatic radiation | per sample | 6,480.00 |
H0034 | Measurement of deep defects by excitation-induced electrical behavior of the semiconductors | per sample | 30,225.00 |
H0035 | Molecular bond analysis of materials with mid-infrared light | per sample | 2,160.00 |
H0036 | Quantitative Analysis of Cross-Linking Percentages in Encapsulant-Containing Samples Using Chemical Testing Methods | per sample | 20,000.00 |
H0037 | Measurement of structures and chemical properties of material by Core Magnetic interaction | per sample | 12,955.00 |
H0038 | Cryogenic Temperature Measurement of defects by the behavior of electron spin resonance in the material | per sample | 85,358.00 |
H0039 | Room-Temperature Measurement of defects by the behavior of electrons in the material | per sample | 12,955.00 |
H0040 | Sputter | per sample | 1,300.00 |
H0041 | Metal evaporation | per sample | 1,800.00 |
H0042 | (E-beam/Thermal for large area) (<1µm) | per hour | 6,000.00 |
H0043 | Micron scaling and photographing the surface | per sample | 435.00 |
H0044 | Surface-to-depth measurement of material contents with a ppm/ppb accuracy | per sample | 12,955.00 |
H0045 | Nickel, Copper, Silver Plating | per hour | 5,000.00 |
H0046 | Band gap and Defect analysis with the effect of Photoluminescence at room Temperatures | per sample | 2,160.00 |
H0047 | Implementation of the PTC simulator as a benchmark for industrial applications | per sample | Pricing will be customized based on demand |
H0048 | Structure and phase analysis by Raman spectroscopy method | per sample | 2,160.00 |
H0049 | Temperature Coefficient Measurement Test | per sample | 26,985.00 |
H0050 | Mono Si wafer (M2,G1) saw damage removal | per hour | 5,000.00 |
H0051 | Mono Si wafer (M2,G1) Surface texturing (forming Pyramid structures on the surface) | per hour | 20,000.00 |
H0052 | SixNy and SiOxNy coating on Si surface | per sample | 2,000.00 |
H0053 | Al2O3 coating on Si wafer surface (<10nm) | per sample | 2,000.00 |
H0054 | Zn:Al coating on Si wafer surface (<10nm) | per sample | 12,000.00 |
H0055 | Optical properties measurement of absorber materials | per sample | 3,455.00 |
H0056 | Standard Test Condition (STC) Performance Test (Double-Sided PV Panels) | per sample | 6,980.00 |
H0057 | Standard Test Condition (STC) Performance Test (Single Sided PV Panels) | per sample | 5,040.00 |
H0058 | Standard Test Condition (STC) Performance Test (Double-Sided PV Panels) | per sample | 2,590.00 |
H0059 | Surface composition analysis mapping by Energy Dispersive Spectroscopy of scanning electron beam | per sample | 8,636.00 |
H0060 | Surface composition analysis by Energy Dispersive Spectroscopy of scanning electron beam for 5 point | per sample | 4,320.00 |
H0061 | Annealing processes (<1000C) | per hour | 2,000.00 |
H0062 | Thermal Imaging | per sample (min 20 samples) | 200.00 |
H0063 | Oxidation of Si surface by thermal method | per sample | 2,000.00 |
H0064 | Thermophysical property measurement at room temperature with the transient plane source method | per sample | 2,160.00 |
H0065 | Thermophysical property measurement at high temperatures with the transient plane source method | per sample | 3,170.00 |
H0066 | Cutting, ablation and marking processes | per hour | 3,000.00 |
H0067 | Reflection, transmission and/or photoluminesence | Up to 1 hour | 900.00 |
H0068 | Determination of charge carriers effective lifetime and implied Voc | per sample | 200.00 |
H0069 | Surface topography roughness measurements with high resolution atomic force microscopy | per sample | 3,455.00 |
H0070 | Determination of structural and morphological features from the surface and interface by high resolution scanning electron microscopy | per sample | 3,455.00 |
H0071 | Determination of structural and morphological features from the surface and interface by high resolution scanning electron microscopy | per sample | 2,590.00 |
H0072 | Surface temperature measurement with high precision | per day | 2,160.00 |
H0073 | Surface resistance measurement | per sample | 100.00 |
H0074 | Glint and glare analysis | per sample | Pricing will be customized based on demand |
DISCOUNT CONDITIONS AND RATES
If a service request is sent on behalf of an institution, organization, university, or firm/company, the discount rates will be applied as follows:
- Middle East Technical University (METU): %50
- Research Infrastructures supported by Law No. 6550: %30
- METU Technopolis Firms: %30
- Foundation Universities: %20
- Public Institutions and Organizations: %30
- Firms/Companies within the scope of Law No. 4961 and 5746: %20
- Public, University, and Private Sector Cooperations: %20 (If the request is sent on behalf of a university)
* OUR PRICES DO NOT INCLUDE VAT.