TK

Our facility analyzes the half-fabricated cells by their structures with Raman, FTIR, XPS, ToF-SIMS, ECV, EDS, XRD, and Spectroscopic Ellipsometry measurements. Elemental bonds and their roles in the solar cells investigated by Raman, FTIR, and XPS characterizations. Meanwhile, ToF-SIMS and ECV prepare doping levels of passive and active dopants in the cells. Furthermore, ToF-SIMS, XPS, and EDS could trace the impurities in the cells and affect their performance.