H0001 Determination of the content of the material and the bonds between atoms with one-thousandth precision
H0002 Boron (B) doping process
H0003 Spin coating
H0004 Spin coating
H0005 Doping Activation Energy Measurement by Current-Voltage Measurement at Cryogenic Temperatures
H0006 Defect analysis with the effect of Photoluminescence at Cryogenic Temperatures
H0007 Screen Printing Metallization
H0008 Screen Printing Metallization
H0009 Measurement of active dopant conce ntration in depth by Electrochemical Capacitance-Voltage (ECV)
H0010 Electroluminescence Imaging (EL) (Module)
H0011 Electroluminescence Imaging (Small area)
H0012 Maximum Power Test (Double-Sided PV Panels)
H0013 Maximum Power Test (Single-Sided PV Panels)
H0014 Solar cell efficiency measurement on an industrial size
H0015 Solar Cell efficiency measurement under flash light
H0016 Pseudo-efficiency measurement of a solar cell under flash light
H0017 Determination of flash-induction interaction charge carrier lifetime depending on temperature
H0018 Phosphorus (P) doping process
H0019 Outdoor tests of photovoltaic modules
H0020 FTIR in glovebox
H0021 Imaging and mapping the structural defects of solar cells by photoluminescence method
H0022 Measurement of metal contact resistance of solar cells (including sample preparation)
H0023 Determination of solar cell contact damages by electroluminescence method
H0024 Horizontal and vertical dimension measurement of phenomena on the surface of solar cells
H0025 18 kWe Solar Simulator use for concentrated solar energy applications
H0026 I-V measurement in ambient conditions (Small area)
H0027 I-V measurement in glove box (Small area)
H0028 Implantation processes (B, P, BF2, F, Ar)
H0029 Current-voltage measurement in thin-film solar cells
H0030 Interstitial Oxygen and Carbon Content Concentration Analysis of Materials by Infrared Ray Absorbtion
H0031 Measurement of quantum efficiency of solar cells under cascade monochromatic radiation
H0032 Determination of right-angle and diffuse transmittance properties of materials under stepped monochromatic radiation
H0033 Determination of right-angle and diffuse reflection properties of materials under stepped monochromatic radiation
H0034 Measurement of deep defects by excitation-induced electrical behavior of the semiconductors
H0035 Molecular bond analysis of materials with mid-infrared light
H0036 Quantitative Analysis of Cross-Linking Percentages in Encapsulant-Containing Samples Using Chemical Testing Methods
H0037 Measurement of structures and chemical properties of material by Core Magnetic interaction
H0038 Cryogenic Temperature Measurement of defects by the behavior of electron spin resonance in the material
H0039 Room-Temperature Measurement of defects by the behavior of electrons in the material
H0040 Sputter
H0041 Metal evaporation
H0042 (E-beam/Thermal for large area) (
H0043 Micron scaling and photographing the surface
H0044 Surface-to-depth measurement of material contents with a ppm/ppb accuracy
H0045 Nickel, Copper, Silver Plating
H0046 Band gap and Defect analysis with the effect of Photoluminescence at room Temperatures
H0047 Implementation of the PTC simulator as a benchmark for industrial applications
H0048 Structure and phase analysis by Raman spectroscopy method
H0049 Temperature Coefficient Measurement Test
H0050 Mono Si wafer (M2,G1) saw damage removal
H0051 Mono Si wafer (M2,G1) Surface texturing (forming Pyramid structures on the surface)
H0052 SixNy and SiOxNy coating on Si surface
H0053 Al2O3 coating on Si wafer surface (
H0054 Zn
H0055 Optical properties measurement of absorber materials
H0056 Standard Test Condition (STC) Performance Test (Double-Sided PV Panels)
H0057 Standard Test Condition (STC) Performance Test (Single Sided PV Panels)
H0058 Standard Test Condition (STC) Performance Test (Double-Sided PV Panels)
H0059 Surface composition analysis mapping by Energy Dispersive Spectroscopy of scanning electron beam
H0060 Surface composition analysis by Energy Dispersive Spectroscopy of scanning electron beam for 5 point
H0061 Annealing processes (
H0062 Thermal Imaging
H0063 Oxidation of Si surface by thermal method
H0064 Thermophysical property measurement at room temperature with the transient plane source method
H0065 Thermophysical property measurement at high temperatures with the transient plane source method
H0066 Cutting, ablation and marking processes
H0067 Reflection, transmission and/or photoluminesence
H0068 Determination of charge carriers effective lifetime and implied Voc
H0069 Surface topography roughness measurements with high resolution atomic force microscopy
H0070 Determination of structural and morphological features from the surface and interface by high resolution scanning electron microscopy
H0071 Determination of structural and morphological features from the surface and interface by high resolution scanning electron microscopy
H0072 Surface temperature measurement with high precision
H0073 Surface resistance measurement
H0074 Glint and glare analysis