Test and Characterization

Our facility analyzes the half-fabricated cells by their structures with Raman, FTIR, XPS, ToF-SIMS, ECV, EDS, XRD, and Spectroscopic Ellipsometry measurements. Elemental bonds and their roles in the solar cells were investigated by Raman, FTIR, and XPS characterizations. Meanwhile, ToF-SIMS and ECV prepare doping levels of passive and active dopants in the cells. Furthermore, ToF-SIMS, XPS, and EDS could trace the impurities in the cells and affect their performance. XRD and Raman spectroscopy present crystallographic information about the layers in the cells, while Spectroscopic Ellipsometry measurements understand the optical properties of the layers. SEM and AFM techniques help us see the morphology and topography of the cells. Four-point probe, Sinton lifetime, and Suns-Voc evaluations demonstrate the potential of cells before fabrication is finished. Generally, we allege our capability to test and characterize skill varieties for solar cell technologies as a pioneer in Türkiye, Eastern Europe, and the Middle East.