Service Device/System : Solar Simulator
Brand-Model of Service Device/System Type: Novel Design
Description: Using a solar simulator with 3 Xenon lamps, each with 6 kWe power, experiments are carried out according to the desired concentrated solar application and the performance of the application is evaluated. Priced according to the application to be used.
unit
Service Device/System: PV Analyzer
Brand-Model of Service Device/System Type: Daystar Multi Tracer MT5
Description: Short- or long-term outdoor performance tests and analyses of photovoltaic mini-modules and modules are conducted and reported.
month
Service Device/System: Firing process by a conveyor belt furnace
Al print; 10 wafers
Service Device/System: Oxygen plasma system
unit
Service Device/System: Thermal Camera
Brand-Model of Service Device/System Type: Flir T530
Description: Thermal imaging of photovoltaic systems or electrical equipment/panels is conducted and reported.
max. 50 unit/day
Service Device/System: Firing process by a conveyor belt furnace
Silver and Al print together; 10 wafers
Service Device/System: E-beam evaporation system for Si or Ge coating
unit
Service Device/System: Fully automatic wet benches for Si wafer patterning and contact isolation
1-100 units (including wafer); Priced over 50 wafers
Service Device/System: Ion implantation process
Process for 1 element; Priced over 3 wafers
Service Device/System: Nano-second laser for scratching thin films
hour
Service Device/System: Solar Cell Flash Tester/Sorter
Brand-Model of Service Device/System Type: Mondragon Assembly
Description: It is an automation system that provides the separation and classification of solar cells by making FF, efficiency, Voc, and Jsc measurements with the flash method.
unit
Service Device/System: Continuous Solar Simulater for industrial-scale samples
Brand-Model of Service Device/System Type: Spire (SPI-CELL TESTER)
Description: It is used as a source of sunlight for various measurements of large-scale solar cells under light.
unit
Service Device/System: Continuous Solar Simulator for Lab-Scale Samples
Brand-Model of Service Device/System Type: Newport
Description: It is used as a sunlight source for various measurements of the solar cell under light.
unit
Service Device/System: Thin-film I-V measurements
Brand-Model of Service Device/System Type: Newport+Keithley 2400
Description: It is used to measure the I-V values that occur in response to these values by applying a voltage or current to the solar cell in a certain voltage range. It is used together with the solar simulator to determine the various properties such as photovoltaic properties and rectification by taking dark-light measurements of the cells.
unit
Service Device/System : Lifetime and i-Voc test system
Brand-Model of service Device/System type: Sinton/WCT120
Description: It is used to determine the life and Jo-Voc characteristics of the charge carriers formed by light in solar cells via the flash method.
unit
Service Device/System: Suns-Voc test system
Brand-Model of Service Device/System Type: Sinton/Suns-Voc
Description: Determining the Voc of the material by modeling the charge carrier behavior due to induction for post metallization under flashlight; determining the pseudo FF (pseudo fill factor) and efficiency (pseudo efficiency) depending on the Jsc value defined by the user
unit
Service Device/System: Temperature-dependent lifetime measurement system
Brand-Model of Service Device/System Type: Sinton
Description: With the flash method, the behavior of the charge carriers formed by the light path in solar cells is modeled for different temperatures, and the lifetime and Jo-Voc characteristics of the charge carriers are determined.
unit
Service Device/System: Contact Resistance Measurement (TLM)
Brand-Model of Service Device/System Type: pvtools/TLM-SCAN+
Description: It is used to determine solar cell contact resistance.
unit
Service Device/System: 4-point probe surface resistance measurement system
Brand-Model of Service Device/System Type: Jandel/RM3000+
Description: With the 4-point probe method, the surface resistance and bulk resistance of solar cells can be measured.
unit
Service Device/System: Quantum efficiency measurement of solar cells
Brand-Model of Service Device/System Type: Bentham/PV300
Description: In a solar cell, it is the ratio of the energy of the light coming on the cell to the number of charge carriers formed by photons and collected by the cell. It gives direct information about the efficiency of the cell.
unit
Service Device/System: Activation energy calculation with cryogenic I-V measurement
Brand-Model of Service Device/System Type: ODTÜ-GÜNAM Designed & Custom Made
unit
Service Device/System: Deep-level transient spectroscopy (DLTS)
Brand-Model of Service Device/System Type: ODTÜ-GÜNAM Designed & Custom Made
unit
Service Device/System: Raman Spectroscopy
Brand-Model of Service Device/System Type: Horiba Jobin Yvon iHR550
Description: It gives information about structural analysis and bond structure of the solar cell material and the modes caused by the phonons.
unit
Service Device/System: Fourier transform infrared spectroscopy (FTIR)
Brand-Model of Service Device/System Type: Thermo Scientific / Nicolet iS-50
Description: It provides information about the bond structures, types, and densities within the material by using the infrared light region in the solar spectrum and scanning the entire wavelength range of solar cells.
unit (room temperature)
Service Device/System: Cryogenic Fourier transform infrared spectroscopy
Brand-Model of Service Device/System Type: ODTÜ-GÜNAM Designed & Custom Made
unit for low temperature
Service Device/System : Spectroscopic Ellipsometry
Brand-Model of Service Device/System Type : Semilab/Sopra GES-5E
Description: It is used to determine the optical properties such as the band gap, thin film thickness, and n and k constants that also investigate the electronic properties of solar cells.
unit
Service Device/System: Right-angle and diffusive optical reflection
Brand-Model of Service Device/System Type: Bentham/PV300
Description: It is used to determine the reflectance rate of the light coming to the surface of the solar cell. In addition, using it together with the permeability rate, the rate of light absorbed by the cell can also be calculated.
unit
Service Device/System: Right-angle and diffusive optical transmission
Brand-Model of Service Device/System Type: Bentham/PV300
Description: It determines the percentage of transmittance of light coming to the surface of solar cells. In addition, the light absorbed by the cell can be calculated by using it together with the reflection rate.
unit
Service Device/System: Optic microscope
Brand-Model of Service Device/System Type: Zeiss
Description: It is used to determine various topographic and morphological properties of solar cells at the micron level.
unit
Service Device/System: Scanning Electron Microscopy(SEM),
Brand-Model of Service Device/System Type: Zeiss/EVO HD15
Description: It provides determining the nanoscale surface and intersection morphologies of solar cells, and visualizing the structural features.
unit
Service Device/System: Scanning Electron Microscopy(SEM),
Brand-Model of Service Device/System Type: Zeiss/EVO HD15800
Description: It provides determining the nanoscale surface and intersection morphologies of solar cells, and visualizing the structural features.
cross
Service Device/System: Enerjy Dispersive Spectroscopy (EDS)
Brand-Model of Service Device/System Type: Zeiss/SmartEDX
Description: It is used for elemental analysis of solar cells, and it provides information on component materials in atomic or percentile form.
EDS-5 Point
Service Device/System: Energy Dispersive Spectroscopy (EDS)
Brand-Model of Service Device/System Type: Zeiss/SmartEDX
Description: It is used for elemental analysis of solar cells, and it provides information on component materials in atomic or percentile form.
mapping
Service Device/System: Atomic Force Microscopy (AFM)
Brand-Model of Service Device/System Type: Nanomagnetics / hpAFM
Description: It gives information about the surface topography and surface properties of solar cells.
unit
Service Device/System: Mechanical Profilometer (DEKTAK)
Brand-Model of Service Device/System Type: Veeco/Dektak M6
Description: It mechanically measures the thickness of the different layers of the solar cell and is used to find the width and length dimensions of the metal contacts on it.
unit
Service Device/System: Photoluminescence imaging and mapping device
Brand-Model of Service Device/System Type: Semilab/PLI-1001
Description: Serial resistance mapping of active charge carriers can be made by excitation of the surface of solar cells with laser light, PL spectroscopy and surface mapping.
unit
Service Device/System: Cryogenic Photoluminescence Spectrometer
Brand-Model of Service Device/System Type: ODTÜ-GÜNAM Designed & Custom Made
unit for low temperature
Service Device/System: Electroluminescence Imaging System
Brand-Model of Service Device/System Type: MBJ/SolarCell EL-Lab
Description: It is used to determine the operability and continuity of the contacts depending on the amount of radiation at the applied current after the contacts of the solar cells are formed.
unit
Service Device/System: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Brand-Model of Service Device/System Type: ION-TOF5
unit for Intensity vs. Sputter-Time
Service Device/System: Electrochemical Capacitance‐Voltage Measurement (ECV)
Brand-Model of Service Device/System Type: WEP/CVP21
Description: During the systematic chemical etching of the solar cell surface, it provides information about the doping rate of the cell by the method of determining the number of charge carriers in layers.
um depth